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第三代
半導(dǎo)體測(cè)試家族
Third generation semiconductor testing family
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QT-3104 QG gate charge test

QT-3104 QG meets the tiny QG value test of SiC devices.



Support double DIE

Overload and undervoltage protection

High precision testing

Support extension

Model QT-3104 QG
Product Advantages Meets the tiny QG value test of SiC devices
Key Features ? Test capability: 200A/150V 150A/1000V




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